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For more details on how to set up the TEM for selected area diffraction, see this Microscopy Today article or the Transmission Electron Microscopy book by Williams and Carter. This guide describes all the steps for setting up a TEM for selected area electron diffraction but focuses on parameters important for getting the best data from a counting camera. Some correction of the diffraction focus may be necessary to make the spots as small as possible. The microscope is set to diffraction mode so that the projector lenses form an image of the back focal plane on the camera. Then a selected area aperture is used to define the region of the sample from which to form the diffraction pattern. The electron beam is set as parallel as possible to collect a selected area diffraction pattern. We describe four of these here, with example data from the Metro and K3 cameras. There are many ways to configure a transmission electron microscope (TEM) to collect electron diffraction data. Jump to Setting up dose rate for diffraction Types of diffraction
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